19 Abnormal operation
19.1 Add the following new paragraph after the third paragraph of the test specification:
Appliances incorporating contactors or relays are subjected to the test of 19.14.
Add the following new subclause:
19.7 In the second paragraph, replace “IEC 60252” by “IEC 60252-1”.
19.11 Replace the second and third paragraphs by the following:
Appliances incorporating an electronic circuit are subjected to the tests of 19.11.3 and
19.11.4.

Add the following as a new second paragraph:
Appliances incorporating an electronic circuit that relies upon a programmable component to
function correctly are subjected to the test of 19.11.4.8, unless restarting at any point in the
operating cycle after interruption of operation due to a supply voltage dip will not result in a
hazard. The test is carried out after removal of all batteries and other components intended to
maintain the programmable component supply voltage during mains supply voltage dips,
interruptions and variations.
In the existing third paragraph, replace “switch” by “device” in two places.
In the sixth paragraph replace “all three” by “both” and delete the last dashed item.
19.11.2 In the first paragraph of the test specification, add the following after Note 2:
g) failure of an electronic power switching device in a partial turn-on mode with loss of
gate (base) control. During this test, winding temperatures shall not exceed the values
given in 19.7.
NOTE 3 This mode may be simulated by disconnecting the electronic power switching device gate (base)
terminal and connecting an external adjustable power supply between the gate (base) terminal and the source (emitter) terminal of the electronic power switching device. The power supply is then varied so as to achieve a current that will not damage the electronic power switching device but give the most onerous conditions of test.
NOTE 4 Examples of electronic power switching devices are field effect transistors (FET’s and MOSFET’s) and bipolar transistors (including IGBT’s).
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